Wafer Clean 2200

Wafer Clean 2200

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The Bruker Wafer Clean 2200 System removes particulate contamination and thin film organic residues from silicon, compound semiconductor, MEMS and thin film head substrates using a unique carbon dioxide (CO2) snow cleaning process. CO2 snow cleaning is fast, environmentally friendly and non-damaging. The all-dry process offers numerous advantages over conventional wet and plasma cleaning techniques. This fully automated, high volume production system is field proven with over 100 systems running 24/7 in high volume production applications around the globe.

Categories: Cryo Dry Cleaning, Semiconductor Solutions

Description

The Bruker Wafer Clean 2200 is a cryogenic dry CO₂ wafer cleaning system engineered to remove particulate contamination and thin organic residues from silicon, compound semiconductor, MEMS, and thin film head substrates. It uses a unique CO₂ snow cleaning technology that is fast, non-damaging, and completely dry, offering substantial advantages over traditional wet or lasma cleaning techniques.

The process is environmentally safe, solvent-free, and generates zero hazardous waste. The system is fully automated and optimized for high-volume semiconductor production, with more than 100 units operating 24/7 worldwide. Its raster scan movement and precision control enable global and local cleaning with high efficiency, achieving particulate removal down to 120 nm and eliminating ion beam etch veil and fence artifacts.

The Wafer Clean 2200 is widely used for photoresist veil removal, MEMS device cleaning, and general cryogenic CO₂ cleaning applications. Its capabilities help improve device reliability and wafer-level yield.

Wafer Clean 2200 — Summary Table

Category Key Details
System Type Cryogenic dry CO₂ wafer cleaning system
Cleaning Method CO₂ snow cleaning; all-dry, non-damaging, solvent-free
Key Functions Removes particulates and thin organic residues from silicon, compound semiconductor, MEMS, and thin film substrates
Throughput 25 wafers per hour (WPH)
Motion System Raster scan movement for uniform coverage
Cleaning Modes Supports global and local cleaning
Yield Benefits Improves wafer-level yield by removing particles and residues
Cleaning Resolution Effective particle removal down to 120 nm
Artifact Removal Removes ion beam etch (IBE) veil and fence residues
Environmental Benefits Environmentally safe, solvent-free, zero hazardous waste
Production Readiness Fully automated; over 100 systems active in 24/7 high-volume production
Core Applications Photoresist veil removal, MEMS device cleaning, cryogenic CO₂ cleaning processes
Ideal Users Semiconductor fabs, MEMS manufacturers, thin-film device producers


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