SmartProber-P1

SmartProber-P1

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The SmartProber-P1 is aimed at the next-generation over 5.5 kOe. Various configurations of this type of SmartProber are available. If the high perpendicular field is required, but only small samples need to be measured, the automated wafer stage can be replaced with a cheaper manual stage.

SP-P1 – 6kOe magnet, 300mm rotary wafer-stage
Configuration options:
C: Additional in-plane magnet module with a field strength of 2kOe
Y: 200mm XY wafer-stage
M: Manual wafer-stage for small samples
L: 10kOe magnet

Categories: Current In Plane Tunneling (CIPT), Semiconductor Solutions

Description

The system provides a configurable design allowing users to choose from multiple magnet options and stage configurations to best match their application requirements. It supports different perpendicular magnetic field strengths, optional in-plane magnetic capability, and several stage types to accommodate wafer sizes ranging from small samples to full 300 mm wafers.

Summary Table

Category Options / Key Details
Perpendicular Magnets • 0.6 T perpendicular magnet
• 1 T perpendicular magnet
In-Plane Magnet Option ~0.2 T in-plane magnetic field
Stage Options • Rotary stage for 300 mm wafers
• XY stage for 200 mm wafers (full in-plane wafer coverage)
• Manual stage for smaller wafers
System Flexibility Fully configurable based on user application requirements


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