| Product Name |
MATRIX-F II – FT-NIR Process Spectrometer |
| Main Purpose |
Direct process measurements with FT-NIR spectroscopy for real-time, on-line analysis |
| Key Advantages |
Real-time, on-line FT-NIR analysis, Fiber optics technology allows spectrometer positioning away from hostile process environments, Industry hardened fiber optic probes access difficult measurement points, Avoids exposure to drastic temperature changes, dust, and dirt |
| Process Control Applications |
Direct monitoring of chemical reactions, Quality monitoring of intermediate and final products, Direct measurement in process reactors or pipelines, Measurements over webs or conveyor belts, Remote measurements over long distances, Improved process understanding and control |
| Determination Capabilities |
Homogeneity of blending processes, Concentrations of constituent chemicals, State of polymerization processes in various industries |
| Maximum Utility |
Only FT-NIR spectrometer measuring material in contact and contactless with one instrument using light fiber technology |
| Fiber Optic Probes |
Classic diffuse reflectance, transflectance or transmission probes with various path lengths, Process flow cells or pilot plant assemblies, Various probe materials available (stainless steel, Hastelloy) |
| Contactless Measurement Heads |
Fiber optic NIR illumination and detection head with tungsten sources, Scattered light collected and guided via fiber optic cable to spectrometer, Contactless remote measurement capability, Up to six heads can be connected to one MATRIX-F II emission or MATRIX-F II duplex spectrometer |
| MATRIX-F II (Classical) |
Classical FT-NIR spectrometer with fiber optic coupling, For use of flow cells and conventional probes (solids and liquids) |
| MATRIX-F II emission |
Special version for fiber-coupled measurement heads, For contactless measurements only |
| MATRIX-F II duplex |
Extension of classical MATRIX-F II, Simultaneous use of fiber optic probes and fiber-coupled sensor heads |
| MATRIX-F exproof |
Ex-proof, ATEX rated version, Complies with II 2G Ex px II T6 Gb and II (1) G [Ex op is T4 Ga] II C standards |
| Advanced Technology |
Dedicated FT-NIR process spectrometer withstanding harsh environments, State-of-the-art optics for outstanding sensitivity and stability in compact module, Innovative design provides consistent high quality results, Less downtime, Direct methods transfer, Enables new applications, Full support of industry standard communication protocols |
| Installation Options |
Laboratory installation as stand-alone system for method development, Direct move into process application, Free-standing unit with NEMA 5/IP65 (splashproof) housing, Standard 19 inch rack mounting in temperature controlled cabinet, Optional 6 port fiber optic multiplexer |
| Key Features |
Accurate in-line results in seconds, Multiple components per measurement, Non-destructive analysis, Optional built-in 6-port multiplexer, Direct method transfer, Rugged design, 10 years warranty on moving parts of interferometer and solid-state laser, Ethernet connectivity and industry standard communication protocols |
| Easy Maintenance |
Designed for reliability and easy maintenance, Consumable components on pre-aligned mounts are user-exchangeable without realignment, Long-life NIR light source and state-of-the-art laser diode, Significantly reduces service operations and cost of ownership, Quick servicing for minimal manufacturing process disruption |
| Instrument Performance Validation |
Equipped with automated filter wheel housing standard materials and filters, OVP (OPUS Validation Program) software executes performance tests, Evaluates and ensures instrument operates within specifications, Precondition for pharmaceutical industry applications |
| Connectivity – CMET Software |
Industry standard interface (OPC), Allows OPUS integration in any process control environment, Wide range of standard communication interfaces and protocols including 4-20mA, Modbus, Profibus DP and OPC |
