Hysitron IntraSpect 360

Hysitron IntraSpect 360

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Bruker’s Hysitron IntraSpect 360 brings quantitative mechanical property characterization to X-Ray microscopes (XRM) and beamlines. This unique system can be used to perform a variety of mechanical tests such as indentation, compression, fatigue, and bending, which can then be correlated to 2D or 3D images from the host microscope.

Categories: Nanomechanical Metrology Tools, Semiconductor Solutions

Description

Feature Description
Performech Advanced Control Module Ensures precise, feedback-controlled nanomechanical testing with automated data analysis via TriboScan software.
360° X-Ray Transparent Viewing Window Provides unobstructed imaging and facilitates μCT studies of material deformation, including fracture and failure onset.
Three-Plate Capacitive Transducer Technology Delivers exceptional stability during 4D studies of material failure, such as crack propagation at fiber-matrix interfaces or void behavior in welds.
Testing Modes Load or displacement-controlled nanoindentation, compression, bending, fatigue.
Load and Displacement Capabilities Up to 10 N maximum force and 80 μm displacement, suitable for diverse materials including composites, ceramics, metals, and biological samples.
Piezoelectric Load Cell Combined with three-plate capacitive transducer, increases displacement range while maintaining ultra-low noise and minimal heat generation for stable long-duration tests.
μCT Imaging Integration Seamless X-ray transparent window allows high-quality computed tomography imaging of internal deformation during testing.
Long-Term Testing Stability Supports tests lasting up to 168 hours with Bruker’s reference frequency correction for consistent performance.
Applications Characterization of internal deformation, fracture, and failure in composites, metals, ceramics, natural, and biological materials.

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