The SmartProber-P1 is aimed at the next-generation over 5.5 kOe. Various configurations of this type of SmartProber are available. If the high perpendicular field is required, but only small samples need to be measured, the automated wafer stage can be replaced with a cheaper manual stage.
SP-P1 – 6kOe magnet, 300mm rotary wafer-stage
Configuration options:
C: Additional in-plane magnet module with a field strength of 2kOe
Y: 200mm XY wafer-stage
M: Manual wafer-stage for small samples
L: 10kOe magnet
This low-cost table-top equipment comes with manual x-y positioning, fully automated probe landing, an in-plane magnet as well as an anti-vibration table. The open nature, low cost, and versatility make the
SmartProber-TT especially suited for research and/or development.
Sample size: up to 6″ wafers, up to 1.3 mm thickness
