Hysitron BioSoft

The Hysitron TS 75 TriboScope delivers quantitative, rigid-probe nanoindentation and nanotribological characterization capabilities to Bruker’s world-leading atomic force microscopes. The Hysitron TriboScope interfaces with select Dimension and MultiMode AFMs to expand the characterization capabilities of these microscopes. By utilizing a rigid test probe, the TriboScope removes the intrinsic limitations, variability, and complexity associated with cantilever-based measurements to deliver quantitative and repeatable mechanical and tribological characterization over nanometer-to-micrometer length scales.

Bruker’s Hysitron IntraSpect 360 brings quantitative mechanical property characterization to X-Ray microscopes (XRM) and beamlines. This unique system can be used to perform a variety of mechanical tests such as indentation, compression, fatigue, and bending, which can then be correlated to 2D or 3D images from the host microscope.

Bruker’s Hysitron BioSoft In-Situ Indenter is a first-of-its-kind instrument specifically designed for multiscale quantitative mechanical testing of biological materials and soft matter, such as hydrogels. BioSoft synchronizes powerful mechanical and optical characterization techniques to achieve a comprehensive understanding of the mechanics of biomaterials. This portable system integrates with existing inverted optical microscopes to bring advanced biomechanical testing capabilities into your laboratory.

Based on non-contact optical techniques, FilmTek tools simultaneously measure multiple-angle and multi-modal data to determine film thickness and refractive index. By measuring multiple angles of incidence, a wavelength shift is introduced between spectra collected at different angles. The wavelength shift between the spectra is only a function of the refractive index of the film and the angle difference between the spectra. By independently determining refractive index from a wavelength shift (as opposed to extracting index information from amplitude changes), FilmTek tools have best-in-class performance for film thickness and refractive index measurement. This level of performance allows FilmTek tools to address applications that otherwise may not be possible with more conventional ellipsometry or reflectometry methods.