| Product Name |
VERTEX 80/80v – High-End Research FT-IR Spectrometers |
| Main Purpose |
Most powerful bench top purge and vacuum spectrometers for high-end research applications |
| Spectral Range Extension |
Covers spectral range from far IR/terahertz through mid and near IR, visible, up to ultraviolet, Pre-aligned optical components, Actively aligned UltraScan™ interferometer for easy range change and maintenance |
| BMS-c Beamsplitter Exchange |
High-precision beamsplitter exchange option for VERTEX 80v vacuum spectrometer, Remotely controlled automatic exchange of up to four different beamsplitters under vacuum conditions, Complete spectral range from UV/VIS to far IR/THz measurable without venting spectrometer optics bench |
| New Broad Band FIR/THz Beamsplitter |
Covers nominally spectral range from above 900 cm-1 to approximately 5 cm-1 in one measurement, Connects mid IR with very long wave FIR/THz wavelength ranges, Valuable for research and development of semiconducting and inorganic materials |
| Standard Optical Resolution |
Apodized spectral resolution better than 0.2 cm-1, Sufficient for most ambient pressure gas phase studies and room temperature sample measurements |
| High Optical Resolution |
PEAK resolution better than 0.06 cm-1 for advanced low temperature work, Highest spectral resolution achieved using commercial bench top FT-IR spectrometer, Resolving power better than 300,000:1 in visible spectral range |
| Versatility |
Most flexible and expandable R&D vacuum FT-IR spectrometer available, Evacuated optics bench provides PEAK sensitivity in mid-, near- and far IR regions, No masking of weak spectral features by air water vapor absorptions, Outstanding results in nanoscience research down to less than 10-3 monolayers |
| Beam Ports Configuration |
Five beam exit ports (right, front, left side), Two beam input ports (right and rear side), Virtually no limitations with respect to flexibility |
| Simultaneous Connections |
Synchrotron light source via rear side input port, PMA 50 polarization modulation accessory at right side exit beam, Fiber optics coupling at right front side port, Bolometer detector at left front, HYPERION series FT-IR microscope at left side exit beam |
| EMILIE™ Compatibility |
First nanomechanical infrared analyzer for FT-IR spectroscopy, Developed in collaboration with Invisible Light Labs, Picogram-level sensitivity without cryogenic cooling, Analyzes aerosols, nanoplastics, biopharmaceuticals, and trace-level samples, Direct sample collection, Broad spectral coverage, In-situ thermal desorption |
| Broadest Spectral Coverage |
UV/VIS region (50,000 cm-1) to FIR/THz region (5 cm-1), Highest spectral and temporal resolution, Unmatched level of flexibility, PEAK technology for high-end research applications |
| Research & Development Applications |
Continuous and Step Scan technology for amplitude/phase modulation spectroscopy, Rapid, interleaved and Step Scan for high temporal resolution experiments, Characterization of metamaterials, High resolution spectroscopy for gas analysis (resolutions better than 0.06 cm-1), Vacuum FT-IR beamline installations, Stopped-flow methods for enzyme catalysis experiments, External adaptation of ultrahigh vacuum measurement chambers, FT-IR spectroelectrochemistry for in-situ investigation of electrode surfaces and electrolytes |
| Pharma Applications |
Determination of absolute configuration of molecules (VCD), Characterization of stability and volatile content of medical drug products by thermal analysis (TG-FT-IR), Differentiation of polymorphs of active pharmaceutical ingredients in far infrared region |
| Polymers and Chemistry Applications |
Identification of inorganic fillers in polymer composites in far infrared region, Dynamic and rheo-optical studies of polymers, Determination of volatile compounds and characterization of decomposition processes by thermal analysis (TGA-FT-IR), Reaction monitoring and reaction control (MIR fiber probe), Identification of inorganic minerals and pigments |
| Surface Analysis Applications |
Detection and characterization of thin and monolayers, Surface analysis combined with polarization modulation (PM-IRRAS) |
| Material Science Applications |
Characterization of optical and highly reflective materials (windows, mirrors), Investigation of dark materials and depth profiling by Photo-Acoustic Spectroscopy (PAS), Characterization of emittance behavior of materials |
| Semiconductors Applications |
Determination of oxygen and carbon contents in silicon wafers, Low temperature transmittance and photoluminescence (PL) measurements of shallow impurities for quality control |
| External Accessories |
PMA 50 Polarization Modulation Accessory for VCD and PM-IRRAS, PL II Photoluminescence module, RAM II FT-Raman module and RamanScope III FT-Raman microscope, TGA-FT-IR coupling, HYPERION series FT-IR microscope, HYPERION 3000 FT-IR imaging system, HTS-XT High Throughput Screening eXTension, IMAC Focal Plane Array macro imaging accessory |
| External Sample Handling |
External sample compartment XSA (evacuable or purgeable), External vacuum tight UHV chamber adaptation, Vacuum PL/PT/PR measurement unit, Low temperature liquid He or cryogenic liquid free cryostats, Fiber optic coupling unit with MIR or NIR fiber probes for solids and liquids, Large integrating spheres, Auto sampler devices |
| Patent Protection |
Technologies protected by US 7034944 patent |
