| Product Name |
verTera THz extension for VERTEX 80v FT-IR Spectrometer |
| Main Purpose |
Access to single digit wavenumber regime and highest resolution without cryogenically cooled components |
| Key Features |
Integrated state of the art cw THz technology, Spectral range down to 3 cm-1 (< 90 GHz), Unique spectral resolution < 0.0007 cm-1 (< 20 MHz), Same sample compartment and accessories for FT-IR and THz, Highest THz performance by vacuum and unique THz algorithm, FT-IR and THz controlled via powerful OPUS software |
| Technology |
High precision semiconductor based photomixers, Converts near infrared laser light into THz radiation, Source and detector integrated into VERTEX 80v beam path, Class 1 NIR laser radiation connected via fiber and vacuum tight feedthrough |
| Vacuum Operation |
Eliminates unwanted atmospheric interferences, Provides utmost stable conditions, Results in significantly higher THz performance |
| Unique THz Data Processing |
Standard approach extracts just extrema of oscillating photocurrent signal which degrades spectral resolution, verTera uses unique algorithm achieving significantly better effective spectral resolution < 0.0007 cm-1 (< 20 MHz) similar to applied THz step size |
| Spectral Coverage |
VERTEX 80v with verTera extension covers impressive spectral range from 3 cm-1 to 50,000 cm-1 from THz to UV in broadest configuration |
| Compatible Accessories |
Several THz compatible FT-IR sample compartment accessories, Transmittance, Gas cells, Reflectance, THz compatible ATR units, Allows unified workflow in extremely broad spectral range |
| Measurement Convenience |
Convenient FT-IR and cw THz measurements in same vacuum sample compartment under identical conditions |
| Applications |
Polymorphism, Polymer research, High resolution gas spectroscopy, Crystal structure (solid state and semiconductor physics), Pharma or drug related research |
| Silicon Wafer Analysis |
THz transmittance of ultrapure silicon wafer proves spectral range down to 3 cm-1, Observed interference fringes due to multiple internal reflections inside wafer in good accordance with sample thickness |
| Gas Spectroscopy |
Reveals pure rotational transitions at low pressure, Unique achievable spectral resolution < 0.0007 cm-1 (< 20 MHz) |
| verTera Versions |
Three different versions accessing different spectral regimes, All achieving same unique spectral resolution better than 0.0007 cm-1 (20 MHz), Spectral range above upper limit covered without gap by FT-IR mode of VERTEX 80v using room temperature components |
| Advantages over Bolometers |
Bolometers require liquid Helium (adds costs, demands expertise, not available in some regions), Alternative dry pulse tube cooled bolometers are costly, cause harmful vibrations, require several hours cool down time, verTera ready at push of button, Creates no nameable operation costs, Achieves superior lower spectral limit and resolution |
